专利内容由知识产权出版社提供
专利名称：Image sensor test patterns for evaluating
light-accumulating characteristics of imagesensors and methods of testing same
发明人：Young-chan Kim申请号：US11315471申请日：20051222
公开号：US20060138488A1公开日：20060629
专利附图：
摘要：An image sensor test pattern provides time efficient optical testing of CMOSimage senors at a single luminous intensity. These test patterns include at least first and
second arrays of pixels having different light-accumulating characteristics. The differentlight-accumulating characteristics may be achieved multiple different ways. In some cases,the photodiodes in the first array of pixels are larger than photodiodes in the secondarray of pixels. In other cases, the photodiodes in the first array of pixels have open holesof a first size and the photodiodes in the second array of pixels have open holes of asecond size less than the first size. In still other cases, the photodiodes in the first arrayof pixels have colors filters of a first density (or first thickness) and the photodiodes inthe second array of pixels have color filters of a second density (or second thickness) lessthan the first density (or first thickness).
申请人：Young-chan Kim
地址：Gyeonggi-do KR
国籍：KR
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